♦ Fully integrated prober and tester can improve efficiency.
♦ Adapt on Flip chip LED.
♦ Patented upper and lower integrated spheres design.
♦ Apply on both wafer form and chip form.
♦ Special calibration jig can process by TO-CAN/SMD/K2.
♦ Integrated with Keithley source & meter instruments.
♦ Leading innovation:Measure visiable and invisible light without
changing software and hardware.