Integrated VCSEL wafer probing and testing system
| Integrated VCSEL wafer probing and testing system |
✹Automatic wafer-prober alignment system
✹Compatible for 100ns short pulse measurement (20A/30V) Compatible for CW mode measurement (1A/45V)
✹ Triple function measurement (LIV+NF+FF)
✹Wafer Size: Up to 8 inches
✹Temperature range: -40°C to 200°C
✹Compliant with SEMI S2 design
- Markets
Optoelectronic Industry / Optical Communication/ Optical Sensing IndustryIndustry
- Applications
Wafer testing
- Materials
VCSEL
Integrated VCSEL wafer probing and testing system
Integrated VCSEL wafer probing and testing system is primarily designed for inspection of VCSEL wafers. It features a 3-in-1 integrated testing module that includes optoelectronic (LIV) measurement, near-field (NF), and far-field (FF) testing capabilities. It supports nanosecond (ns)-level short-pulse testing. This VCSEL testing system can be equipped with various current sources and temperature control specifications to meet comprehensive VCSEL characterization requirements.
Test Specification
Compatible for short pulse measurement
Temperature range: -40°C to 200°C
Wafer Size: Up to 8 inches
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