APT 6000

LED chip & wafer probing and testing system

LED chip & wafer probing and testing system
integrated prober & tester system!
Light receiving structure by sphere & light covering design, avoid ambient light interfered!

    
  • high-end lead screw, higher strength
  • Load cell adjustment, better probe mark, longer lifetime for needle
  • recording alarm system.
  • optimized mechanical structure, increase the utilization of site
  • Light receiving structure by sphere
  • available for both chip form & wafer form