Auto Semiconductor Wafer Probing System
| Auto Semiconductor Wafer Probing System |
| Designed for wafer probing of discrete components (Diodes, Schottky, TVS) and power devices (MOSFETs, IGBTs). The automated system is equipped with an ultra-high precision alignment system and visual positioning technology, featuring efficient wafer exchange capabilities. It supports high voltage measurement, high current measurement, and temperatures measurement (High temp., Low temp., room temp.) |
■ Markets：
Optocommunication
■ Applications：
Discrete devices measurement(Diode/Schottky/TVS)
Power Semiconductor Devices(MOSFET/IGBT)
■ Materials：
GaN、SiC wafer
■ Automatic adjustment of the probe card and wafer
■ Compatible for High Voltage / High Current measurements
■ Compatible for temperature dependent measurement (-40~ 200°C)
■ Compatible for integration to multiple SMUs
■ Compatible for 6”/8” wafer test
■ Compliant with SEMI S2 certification
Test Specification
Voltage Output Range：Max 3000 V
Current Output Range：Max 200 A
Supports probe holder testing
probe card testing
Why FitTech?
FitTech focus on design and manufacturing photoelectric related system. We provide accurate and exquisite processing quality with leading R&D capability.
With well experienced and our completed and elite R&D team, customized such as automated, integrated with robot, system integration, etc. are all available.
FitTech's Laser cutting/drilling Machine that design and manufactured in Taiwan. And we also provide instance after service by our elite technical team.