Laser diode probing & testing solutions

Laser diode probing & testing solutions

 

✹ General measurement of Laser Diode

✹ VCSEL test

✹ PD test

✹ EML(DFB/FP/EML) test


 

Laser Diode The application of Laser diode

With the continuous expansion and growth of LiDAR's application, such as optical communications, 5G, 3D sensing, and automotive applications, Significant increase in demand of surface-emitting lasers (VCSEL, PD) and edge-emitting lasers (DFB, FP, EML), which drives the demand for test equipment. FitTech has invested in the development of laser diode component test equipment for many years. It provides customers with a full range of test solutions, and support customized and integrated test equipment according to customers' relevant test requirements.

 


 

 

General measurement of Laser Diode - LIV measurement

LIV measurement is mainly for current, voltage and optical power measurement of LD components. The complete measurement data can be obtained through data calculation and image processing. The test equipment from FitTech support integrated voltage/current pulse measurement (Pulsed optical measurement) functions which minimizes self-heating of the DUT and effectively obtain test values to investigate the DUT performance.

 

 

 

General measurement of Laser Diode – Optical Spectrum analysis

Optical spectrum analysis is one of the test parameter of various types of LD (VCSEL/DFB/FP/EML). The LD related tests provided by FitTech can support TO-CAN monitoring measurement, high/low temperature control system, OSA integration and other functions. We also provide customized integration according to various customer’s requirement.

 

 

 

High/Low temperature control system

Integrate temperature control system to perform measurement at -40℃~95℃.

 


Low temp. test


Room temp. test


High temp. test

 

 

Why FitTech

 

 othersFitTech
Testing conditionFixed and irreversible itemCustomized integration 
Automation and merchandiseFixed solutionCustomized integration of Prober and Tester 
Software interfaceIndependent developmentIndependent development
sales and technical teamsIncomplete equipment informationVertical integration and face to face service with years of experience 
After serviceMostly located oversea with long response Having service center both in domestic and overseas  

 

Please contact us for detailed equipment specification information or functional integration requirements.

Product inquiry / Contact us


 

Testing condition of VCSEL

 

With the fermentation of terminal applications, the demand for VCSEL component capabilities has increased, with more sensitivity, longer sensing distance, and higher PCE (photoelectric conversion efficiency). Therefore, relevant data monitoring during testing has become an important basis to improve component performances.

The VCSEL Prober and Tester from FitTech supports highly mechanism integration and testing stability. To support 4-6 inch wafer level and high power VCSEL testing. The corresponding model type can provide various testing items, such as Near Field Pattern, Far Field Pattern, eye safety, divergence angel, M2, Emitters distribution, uniformity and so on.

 

 


Uniformity & Leveling of emitters


Emitters amount and Beam waist diameter


Emitters distribution

 

 


M2 measurement


Divergence Angle


Eye Safety

 

 

Testing Solution of VCSEL

 

FitTech possess excellent optoelectronic integration technology with years of experience. We also have an ability to equip with self-developed control software, humanize to setup testing parameter and obtain testing report. It can judge good and bad die on VCSEL testing equipment and also record every testing data, to analysis DUT performance. The testing data can support chip manufacturer to investigate relative parameter and elevate product efficiency.

 

Please contact us for detailed equipment specification information or functional integration requirements.

 

Product inquiry / Contact us


 

Testing Condition of PD

 

PD (Photodetector) plays an important role as a photodetector in the field of optical communications and automotive LiDAR which with fast response of sensitivity. FitTech provides high mechanism integration and high testing stability equipment, which can collocate with corresponding standard light sources and perform PD component responsivity, CV / IV measurement to assist customers in judging important features of PD performance.

 

 


Responsivity


Auto Coupling


CV-IV measurement

 

 

Testing Solution of PD

 

FitTech possess excellent optoelectronic integration technology with years of experience. We also have an ability to equip with self-developed control software, humanize to setup testing parameter and obtain testing report. It can judge good and bad die on PD testing equipment and also record every testing data, to analysis DUT performance. The testing data can support chip manufacturer to investigate relative parameter and elevate product efficiency.

 

Please contact us for detailed equipment specification information or functional integration requirements.

 

Product inquiry / Contact us


 

Testing items of DFB/FP

 

FitTech’s equipment has a high mechanism integration and can provide automated DFB/FP probing and sorting function. The measurement items include wavelength measurement and FFP measurement. It can also integrate DFB die appearance inspection (AOI/ VI), input OCR function and customized output form.

Smart Optical Character Recognition and automatic probing and testing system increase processing efficiency, monitoring the DUT performance and elevate issue Retrospectivity.

 

 


Appearance inspection (AOI/VI)


Optical character recognition


Input and output stage for Wafer/ Gel Pak

 

 

Testing items of EML

 

EML testing equipment can support automatic probing and sorting, include DFB measurement, EA measurement and SOA measurement. It can according to customer’s requirement to integrate high/low temperature inspection, AOI/ VI, OCR and customized input/output form for DUT.

 


DFB measurement


EA measurement


SOA measurement

 

 

Testing solution of DFB/FP/EML

 

FitTech possess excellent optoelectronic integration technology with years of experience. We also have an ability to equip with self-developed control software, humanize to setup testing parameter and obtain testing report. It can judge good and bad die on DFB/FP/EML testing equipment and also record every testing data, to analysis DUT performance. The testing data can support chip manufacturer to investigate relative parameter and elevate product efficiency.

 

 

Product inquiry / Contact us