VCSEL Wafer Probing and Testing System
✹Integrated system for prober & tester ✹Support LIV curve measurement ✹Highly integration for mechanism & Highly stability for testing ✹High power / Low power components purpose ✹Temperature-controlled chuck table and other additional equipment are optional ✹Support 4"~6" wafer testing |
- Markets
Optocommunication industry / 3D Sensing industry
- Applications
Probing and Testing
- Materials
Vertical Cavity Surface Emitting Laser(VCSEL)
VCSEL Wafer Probing and Testing System
The VPT series VCSEL wafer probing and testing system is specifically designed to test the performance of VCSEL wafers. It accurately measures both the optical and electrical characteristics of VCSELs to ensure high performance in applications such as communication and 3D sensing. The VPT series delivers precise measurement data and can be customized to meet customer specifications, with multiple integrated functions to support diverse applications and testing standards, further enhancing product quality and stability.
LIV Curve test item
Optical test items：Ith、SE、Linearity、Kink、Pmax、Rollover、P1/P2
Electrical test items：Rs、Imax、V1/V2
Optional Items
Temperature-controlled chuck table
Configurable to meet specific test temperature range requirements
OSA
Configurable according to customer requirements
Needle cleaning module
Brush or needle cleaning pad
Handheld Barcode reader
Tracking product information
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